大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Wessex Institute of Technology 的图书(共2726本)

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77)

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索取号：TN153-53/E803/1977
作者：
出版社：Bristol : Institute of Physics, 1977.

Scanning electron microscopy, 1972 : IIT research institute Chicago, Illinois 60616 USA

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索取号：TN153-53/E804/1972
作者：Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、
出版社：Chicago, Ill. : IITRI, 1972.

Conference record of 1974 Conference on Display Devices and Systems : papers presented at the Statler Hilton, New York City, October 9-10, 1974

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索取号：TN141-53/E801/1974
作者：Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、
出版社：[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.

GNVQ advanced information technology

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索取号：G202-4/E20032
作者：
出版社：London : DP Publications, 1995.

Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971

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索取号：TN14-53/E801/11
作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、
出版社：San Francisco, Calif. : San Francisco Press, c1971.

Record of the 10th symposium on electron, ion, and laser beam technology

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索取号：TN14-53/E801/10
作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、
出版社：San Francisco : San Francisco Press, [c1969].

GNVQ intermediate information technology

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索取号：G202-4/E20031
作者：Hodson、 Peter、 1948-、Watkins、 Mike、 1947-、
出版社：London : Letts Educational, 1996.

1987 proceedings : 37th Electronic Components Conference ; May 11-13, 1987, the Boston Park Plaza Hotel & Towers, Boston, Massachusetts

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索取号：TN11-53/E701/37
作者：Electronic Components Conference (37th : 1987 : Boston、 Mass.)、IEEE Components、 Hybrids、 and Manufacturing Technology Society、Electronic Industries Association、
出版社：New York : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Order from IEEE Service Center, 1987]

Electronic Components Conference : May 3, 4, 5, 1967

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索取号：TN11-53/E701/17
作者：Electronic Components Conference (17th : 1967 : Washington、 D.C.)、Schwartz、 Bernard、 Dr.、Morehouse、 C. K.、Institute of Electrical and Electronics Engineers.、Electronic Industries Association.、
出版社：New York : Institute of Electrical and Electronics Engineers, 1967.

IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973

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索取号：TN102-53/E801/11
作者：Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、
出版社：New York, N.Y. : IEEE, c1973.

Proceedings

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索取号：TN1-53/E906
作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、
出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984

1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970

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索取号：TN06-53/E802/1970
作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.

Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973

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索取号：TN06-53/E801/11
作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972

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索取号：TN06-53/E801/10
作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.

Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971

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索取号：TN06-53/E801/9
作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.

Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico

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索取号：TN1-53/E805
作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、
出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.